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AI Inspection Solution

High-Precision AI Inspection for the Manufacturing Industry

Features

Photometric Stereo-based AI Inspection that Detects Even Invisible Defects
  • Precision Analysis Based on Surface Reflectance & Shape Separation

    • Separates and analyzes surface reflectance (Albedo) and micro-geometry (Normal) using images captured under multi-lighting conditions
    • Precisely identifies defects that are difficult to distinguish with standard cameras
  • Ultra-Fine Defect Detection & Quantification

    • Analyzes minute surface changes including scratches, dents, contamination, and coating defects
    • Implements data-driven high-precision inspection rather than subjective judgment
  • MLOps-Based Training Optimization

    • MLOps framework managing the entire AI development lifecycle
    • Continuous model advancement by reflecting field data to improve accuracy

Core Values

It solves the detection limitations of visual inspection and delivers new value.
Challenges
  • Detection accuracy variance due to visual inspection

  • Limitations in detecting micro-defects and irregular flaws

  • Difficulty in quantifying and standardizing inspection criteria

Core Values
  • Consistent inspection quality

  • Response to micro, complex, and new defects

  • Continuous inspection accuracy improvement

Core Technology

AI Inspection Solution Process
  • Image Processing
    & AI Detection
  • AI Inspection Judgment
  • Monitoring
  • Anomaly pattern detection based on normal data
  • Normal / defective type classification
  • Precise recognition of object position, size, and shape
  • Noise removal, low-light and backlight correction
  • Automatic defect determination
  • Confidence-based result delivery
  • Inspection history data storage
  • MLOps-based model management
  • Continuous learning with new defect data
  • Ongoing AI performance improvement after field deployment

Case Studies

Detects ultra-fine defects through precision analysis based on images acquired in multi-lighting environments.
  • 01

Photometric Stereo-Based Surface Analysis

  • 02

Metal/Non-Metal Parts Micro-Defect Detection
and Automatic Flaw Detection

  • 03

Semiconductor & Circuit Board Ultra-Fine Defect Analysis

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